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Volumn 57, Issue 8, 1998, Pages 4756-4763
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Implantation and damage under low-energy Si self-bombardment
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001619367
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.57.4756 Document Type: Article |
Times cited : (62)
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References (27)
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