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Applied Physics A: Materials Science and Processing

Volumn 80, Issue 7, 2005, Pages 1541-1545

Influence of self-assembly monolayers on the characteristics of copper phthalacyanine thin film transistor

(6) Xiao, K a Liu, Y a Guo, Y a Yu, G a Wan, L a Zhu, D a

a INSTITUTE OF CHEMISTRY (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER COMPOUNDS; DEPOSITION; DIELECTRIC MATERIALS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GATES (TRANSISTOR); INTERFACES (MATERIALS); MICROELECTROMECHANICAL DEVICES; MONOLAYERS; SILICA; THIN FILM TRANSISTORS; X RAY DIFFRACTION ANALYSIS;

COPPER PHTHALACYANINE; GATE DIELECTRICS; OCTADECYLTRICHLOROSILANE (OTS); VACUUM VAPOR METHODS;

SELF ASSEMBLY;

EID: 18544370736 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-003-2398-8 Document Type: Article

Times cited : (41)

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