Substrate photoelectron enhancement of carbonaceous overlayer Auger emission: effect of the substrate on carbon overlayer thickness determination in XPS

Surface and Interface Analysis

Volumn 27, Issue 8, 1999, Pages 716-727

  Brizzolara, Robert A ^a   Beard, Bruce C ^b  

^a NAVAL SURFACE WARFARE CENTER   (United States)

^b AKZONOBEL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; LANGMUIR BLODGETT FILMS; MATHEMATICAL MODELS; MONOLAYERS; PHOTOIONIZATION; SUBSTRATES; SURFACE STRUCTURE; THICKNESS MEASUREMENT;

CARBONACEOUS OVERLAYER; EBEL MODEL; PHOTOELECTRON ENHANCEMENT; SUBSTRATE EFFECT MODEL;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032654130     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199908)27:8<716::AID-SIA565>3.0.CO;2-R     Document Type: Article

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