Application of electrochemical atomic force microscopy

Fenxi Huaxue

Volumn 32, Issue 3, 2004, Pages 395-401

  Li, Xiaojun ^a   He, Pingang ^a   Fang, Yuzhi ^a   Hu, Jun ^b   Li, Mingqian ^b  

^a EAST CHINA NORMAL UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Electrochemical atomic force microscopy; Electrostatic force; In situ analysis; Review; Surface analysis

Indexed keywords

ANALYTIC METHOD; ATOMIC FORCE MICROSCOPY; CORROSION; ELECTRICITY; ELECTROCHEMISTRY; EVALUATION; FILM; REVIEW; SURFACE PROPERTY;

EID: 1842630623     PISSN: 02533820     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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