In-situ AFM study of pitting corrosion of Cu thin films

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 154, Issue 1-2, 1999, Pages 227-237

  Li, Jun ^a   Lampner, David ^b  

^a Molecular Imaging Corp   (United States)

^b NONE

Author keywords

Benzotriazole (BTA); Corrosion inhibition; Electrochemical atomic force microscope (AFM); Pitting corrosion

Indexed keywords

AROMATIC COMPOUNDS; ATOMIC FORCE MICROSCOPY; CORROSION RESISTANCE; GROWTH (MATERIALS); OPTICAL MICROSCOPY; PHASE EQUILIBRIA; PITTING; THIN FILMS;

BENZOTRIAZOLE; CORROSION INHIBITION; REPASSIVATION POTENTIAL;

COPPER;

BENZOTRIAZOLE DERIVATIVE; BICARBONATE; COPPER;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; CONTROLLED STUDY; CORROSION; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; FILM; MICROSCOPY; PRIORITY JOURNAL;

EID: 0033181073     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(98)00901-7     Document Type: Conference Paper

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