Kelvin probe force microscopic study of anodically and cathodically doped poly-3-methylthiophene

Synthetic Metals

Volumn 110, Issue 2, 2000, Pages 115-122

  Semenikhin, O A ^a   Jiang, L ^b   Hashimoto, K ^c   Fujishima, A ^d  

^a FRUMKIN INSTITUTE OF PHYSICAL CHEMISTRY AND ELECTROCHEMISTRY   (Russian Federation)

^b INSTITUTE OF CHEMISTRY   (China)

^c UNIVERSITY OF TOKYO   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); GRAPHITE; MORPHOLOGY; PLASTIC FILMS; SULFUR COMPOUNDS; SURFACE STRUCTURE; THIN FILMS;

HIGHLY ORIENTED PYROLYTIC GRAPHITE; KELVIN PROBE FORCE MICROSCOPY (KFM); POLYMETHYLTHIOPHENE;

CONDUCTIVE PLASTICS;

EID: 0033909113     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00282-9     Document Type: Article

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