An X-ray tomographic microscope with submicron resolution

Acta Physica Polonica B

Volumn 33, Issue 1, 2002, Pages 463-469

  Stampanoni, M ^a,b   Borchbrt, G L ^b,c   Abela, R ^b   Patterson, B ^b   Vermeulen, D ^b   Ruegsegger P ^b   Wyss, P ^d  

^a Institut Für Biomedizinische Technik   (Switzerland)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 31244433365     PISSN: 05874254     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (13)

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2. A. Koch et al., J. Opt. Soc. Am. A15, 1940 (1998).
3. A. Koch et al., Proc. Int. Conf. Inorganic Scintillators and their Appl., Shanghai, 1997.
4. A. Koch et al., Proc. Int. Conf. SCINT99, Moscow 1999.
5. A. P. Tzannes et al., Opt. Eng., 34, 1808 (1995).
6. M. Kuriyama et al., J. Res. Natl. Inst. Stand. Technol., 95, 559 (1990).
7. K. Sato et al., Rev. Sci. Instrum. 71, 4449 (2000).
8. R. Spal, Phys. Rev. Lett. 86, 3044 (2001).
9. S. Brennan, P. Cowan, Rev. Sci. Instrum. 63, 850 (1992).
10. M. Sanchez del Rio, R. Dejus, SPIE, vol. 3448, 230 (1998).
11. B. Patterson et al., PSI Annual report, SLS, 64 (1999).
12. Polishing and optical contacting have been performed by the optical company Carl Zeiss, Germany.
13. The components have been produced by the company Kohzu Precision Co. Ltd., Japan.