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Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 198-200, Issue , 2002, Pages 3-11

Using X-rays to characterize the process of self-assembly in real time

(5) Richter, A G a Yu, C J a Datta, A a Kmetko, J a Dutta, P a

a NORTHWESTERN UNIVERSITY (United States)

Author keywords

Monolayer growth X rays; Octadecyltrichlorosilane; Self assembly

Indexed keywords

HEPTANE; MONOLAYERS;

LANGMUIR FORM;

X RAYS;

HEPTANE; OCTADECYLTRICHLOROSILANE; SILANE DERIVATIVE; SILICON DIOXIDE; UNCLASSIFIED DRUG;

CONFERENCE PAPER; FILM; KINETICS; MOLECULAR DYNAMICS; OXIDATION; PRIORITY JOURNAL; SURFACE PROPERTY; TECHNIQUE; TIME; X RAY ANALYSIS;

EID: 18344417989 PISSN: 09277757 EISSN: None Source Type: Journal
DOI: 10.1016/S0927-7757(01)00908-6 Document Type: Conference Paper

Times cited : (7)

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