In situ time-resolved X-ray reflectivity study of self-assembly from solution

Langmuir

Volumn 14, Issue 21, 1998, Pages 5980-5983

  Richter, A G ^a   Durbin, M K ^a   Yu, C J ^a   Dutta, P ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHLORINE COMPOUNDS; CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; PHASE INTERFACES; SILICON; SUBSTRATES; SURFACE ROUGHNESS; X RAY ANALYSIS;

OCTADECYLTRICHLOROSILANE; SELF-ASSEMBLED MONOLAYERS (SAM); X RAY REFLECTIVITY;

MONOLAYERS;

EID: 0032183941     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980371h     Document Type: Article

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