Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection, and atomic force microscopy

Journal of Applied Physics

Volumn 85, Issue 2, 1999, Pages 868-875

  Styrkas, D A ^a   Keddie, J L ^a   Lu, J R ^a   Su, T J ^a   Zhdan, P A ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); MOLECULES; NEUTRON REFLECTION; REFRACTIVE INDEX; SURFACES;

MEAN SQUARE ERROR; OCTADECYLTRICHLOROSILANE; SELF ASSEMBLED LAYERS; SPECTROSCOPIC VARIABLE ANGLE ELLIPSOMETRY; X RAY REFLECTION;

ELLIPSOMETRY;

EID: 0033555046     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369205     Document Type: Article

References (33)

1. J. Sagiv, J. Am. Chem. Soc. 102, 92 (1980).
2. J. Ruhe, V. J. Novotny, K. K. Kanazawa, T. Clarke, and G. B. Street, Langmuir 9, 2383 (1992).
3. S. R. Wasserman, G. M. Whitesides, I. M. Tidswell, B. M. Ocko, P. S. Pershan, and J. D. Axe, J. Am. Chem. Soc. 111, 5852 (1989).
4. V. DePalma and N. Tillman, Langmuir 5, 868 (1989).
5. P. Silberman, L. Leger, D. Ausserre, and J. J. Benattar, Langmuir 7, 1647 (1991).
6. T. Nakagawa and K. Ogawa, Langmuir 10, 525 (1994).
7. H. O. Finkles, L. R. Robinson, A. Blackburn, B. Richer, D. Allara, and T. Bright, Langmuir 2, 239 (1986).
8. J. D. Le Grange, J. L. Markham, and C. R. Kurkjian, Langmuir 9, 1749 (1993).
9. G. Fragneto, R. K. Thomas, A. R. Rennie, and J. Penfold, Science 267, 657 (1995).
10. X. M. Zhao, Y. M. Xia, and G. M. Whitesides, J. Mater. Chem. 7, 1069 (1997).
11. Y. N. Xia and G. M. Whitesides, Annu. Rev. Mater. Sci. 28, 153 (1998).
12. Y. Xia, M. Mrksich, E. Kim, and G. M. Whitesides, J. Am. Chem. Soc. 117, 9576 (1995).
13. G. Fragneto, J. R. Lu, D. C. Mc Dermott, R. K. Thomas, A. R. Rennie, P. D. Gallagher, and S. K. Satija, Langmuir 12, 477 (1996).
14. R. M. A. Azzam and N. M. Bashara, in Ellipsometry and Polarized Light (North Holland, Amsterdam, 1977).
15. J. Penfold and R. K. Thomas, J. Phys.: Condens. Matter 2, 1369 (1990).
16. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, Cambridge, 1994).
17. S. N. Magonov and M. H. Whangbo, Surface Analysis with STM and AFM (VCH, Weinheim, 1996).
18. T. Gesang, D. Fanter, R. Hoper, W. Possart, and O. D. Hennemann, Surf. Interface Anal. 23, 797 (1995).
19. B. B. Sauer and D. J. Walsh, Mater. Charact. 24, 5948 (1991).
20. C. Glorieux, P. de Schrijver, and J. Thoen, J. Phys. D 30, 2656 (1997).
21. P. N. Thirtle, Z. X. Li, R. K. Thomas, A. R. Rennie, S. K. Satija, and L. P. Sung, Langmuir 13, 5451 (1997).
22. A. N. Parikh, D. L. Allara, I. B. Azouz, and F. Rondelez, J. Phys. Chem. 98, 7577 (1994).
23. J. R. Lu, T. J. Su, R. K. Thomas, A. R. Rennie, and R. Cubitt, J. Coll. Interface Sci. (in press).
24. E. M. Lee, E. A. Simister, R. K. Thomas, and J. Penfold, J. Phys. Chem. 93, 381 (1989).
25. E. D. Palik, Handbook of Optical Constants of Solids (Academic, London, 1985).
26. N. Tillman, A. Ulman, J. S. Schildkraut, and T. L. Penner, J. Am. Chem. Soc. 110, 6136 (1988).
27. R. B. Beevers, Laboratory Practice, No. 4, 272 (1973).
28. A. I. Vogel, J. Chem. Soc., Part II 1842 (1948).
29. Z. X. Wu, E. B. Sirota, S. K. Sinha, B. M. Ocko, and M. Deutsch, Phys. Rev. Lett. 70, 958 (1993).
30. D. E. Aspnes, J. B. Theeten, and F. Hottier, Phys. Rev. B 20, 3292 (1979).
31. D. L. Angst and G. W. Simmons, Langmuir 7, 2236 (1991).
32. Digital Instruments, Nanoscope III, Manual.
33. E. H. Korte and A. Roseler, Analyst 123, 647 (1998).