Single event effects in the pixel readout chip for BTeV

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 501, Issue 1, 2003, Pages 183-188

  Chiodini, G ^a   Appel, J A ^a   Cardoso, G ^a   Christian, D C ^a   Coluccia, M R ^a   Hoff, J ^a   Kwan, S W ^a   Mekkaoui, A ^a   Yarema, R ^a   Zimmermann, S ^a  

^a FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Pixel detector; Radiation tolerance; Single event effects

Indexed keywords

DOSIMETRY; MICROPROCESSOR CHIPS; PARTICLE BEAM TRACKING; PROTONS; RADIATION DETECTORS;

PIXEL READOUT CHIPS;

READOUT SYSTEMS;

EID: 18344403484     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)02030-2     Document Type: Conference Paper

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