Anomalous conductance quantization in carbon nanotubes

Physical Review Letters

Volumn 94, Issue 2, 2005, Pages

  Biercuk, M J ^a   Mason, N ^a   Martin, J ^a,b   Yacoby, A ^a,b   Marcus, C M ^a  

^a HARVARD UNIVERSITY   (United States)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTANCE MEASUREMENTS; DC CURRENTS; ELECTRICAL CONDUCTION; FABRY-PEROT STRUCTURE;

ATOMIC FORCE MICROSCOPY; BACKSCATTERING; CARRIER CONCENTRATION; CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTANCE; ELECTRON BEAM LITHOGRAPHY; HETEROJUNCTIONS; MAGNETIC FIELDS; QUANTUM THEORY; SEMICONDUCTOR QUANTUM WIRES; TRANSCONDUCTANCE;

CARBON NANOTUBES;

EID: 18144382334     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.94.026801     Document Type: Article

References (31)

1. T. Ando, T. Nakanishi, and R. Saito, Microelectron. Eng. 47, 421 (1999).
2. B. J. van Wees, H. van Houten, C. W. J. Beenakker et al., Phys. Rev. Lett. 60, 848 (1988).
3. A. Yacoby, H. L. Stormer, N. S. Wingreen et al., Phys. Rev. Lett. 77, 4612 (1996).
4. H. van Houten, C. Beenakker, and B. van Wees, in Nanostructured Systems, edited by M. A. Reed (Academic Press, San Diego, 1992), Vol. 35, p. 9.
5. C. Beenakker and H. van Houten, in Solid State Physics - Advances in Research and Applications, edited by H. a. T. Ehrenreich, D. (Academic Press, San Diego, 1991), Vol. 44, p. 1.
6. T. Ando, Semicond. Sci. Technol. 15, R13 (2000).
7. W. Liang, M. Bockrath, and H. Park, Phys. Rev. Lett. 88, 126801 (2002).
8. S. Frank, P. Poncharal, Z. L. Wang et al., Science 280, 1744 (1998).
9. R. D. Antonov and A. T. Johnson, Phys. Rev. Lett. 83, 3274 (1999).
10. J. Appenzeller, J. Knoch, M. Radosavljevic et al., Phys. Rev. Lett. 92, 226802 (2004).
11. A. Javey, J. Guo, Q. Wang et al., Nature (London) 424, 654 (2003).
12. While we cannot exclude the possibility that our nanotubes are small ropes or double walled tubes, all devices for this study can be fully depleted with the back gate. Therefore, it is likely that only a single semiconducting tube is participating in transport. In addition, using TEM analysis of nanotubes grown under similar conditions we were able to distinguish between large ropes and single tubes. Further, we were unable to observe any internal structure in single tubes with diameters less than ∼4 nm.
13. H. W. C. Postma, T. Teepen, Z. Yao et al., Science 293, 76 (2001).
14. D. Bozovic, M. Bockrath, J. H. Hafner et al., Appl. Phys. Lett. 78, 3693 (2001).
15. M. J. Biercuk, N. Mason, and C. M. Marcus, cond-mat/0312276 [Nano Letters (to be published)].
16. N. Mason, M. J. Biercuk, and C. M. Marcus, Science 303, 655 (2004).
17. S. J. Wind, J. Appenzeller, and P. Avouris, Phys. Rev. Lett. 91, 058301 (2003).
18. W. Liang, M. Bockrath, D. Bozovic et al., Nature (London) 411, 665 (2001).
19. L. I. Glazman and A. V. Khaetskii, Europhys. Lett. 9, 263 (1989).
20. N. K. Patel, J. T. Nicholls, L. Martin-Moreno et al., Phys. Rev. B 44, 13549 (1991).
21. P. L. McEuen, M. Bockrath, D. H. Cobden et al., Phys. Rev. Lett. 83, 5098 (1999).
22. We distinguish between this coupling constant and the familiar "lever arm" (ratio of gate capacitance to total capacitance), extracted from Coulomb blockade diamonds. The quantity alpha characterizes a change in Fermi energy induced by a gate, in the present case dominated by a change in density.
23. A. Nojeh, G. W. Lakatos, S. Peng et al., Nano Lett. 3, 1469 (2003).
24. Series resistance is presumably dominated by contact resistance at the Pd-nanotube interface. However, back gate-voltage-dependent scattering within the tube away from the gated region may also contribute.
25. R. Martel, V. Derycke, C. Lavoie et al., Phys. Rev. Lett. 87, 256805 (2001).
26. D. J. Reilly, T. M. Buehler, J. L. O'Brien et al., Phys. Rev. Lett. 89, 246801 (2002).
27. K. J. Thomas, J. T. Nicholls, M. Y. Simmons et al., Phys. Rev. Lett. 77, 135 (1996).
28. S. M. Cronenwett, H. J. Lynch, D. Goldhaber-Gordon et al., Phys. Rev. Lett. 88, 226805 (2002).
29. R. de Picciotto, L. N. Pfeiffer, K. W. Baldwin et al., Phys. Rev. Lett. 92, 036805 (2004).
30. K. A. Matveev, Phys. Rev. Lett. 92, 106801 (2004).
31. V. Rodrigues, J. Bettini, P. C. Silva et al., Phys. Rev. Lett. 91, 096801 (2003).