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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 1, 2001, Pages 213-219

Distributions of interface states and bulk traps in ZnO varistors

(4) Ohbuchi, Y a Kawahara, T a Okamoto, Y a Morimoto, J a

a NATIONAL DEFENSE ACADEMY (Japan)

Author keywords

Bulk trap; Emission rate spectrum; Grain boundary; ICTS; Interface state; SADLTS; ZnO varistor

Indexed keywords

ACTIVATION ENERGY; EMISSION SPECTROSCOPY; GRAIN BOUNDARIES; ZINC OXIDE;

BULK TRAP; INTERFACE STATES;

VARISTORS;

EID: 0035056407 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.40.213 Document Type: Article

Times cited : (32)

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