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Volumn 87, Issue 1-4, 2005, Pages 583-593

Control of random texture of monocrystalline silicon cells by angle-resolved optical reflectance

Author keywords

Optical reflectance; Photovoltaic cells; Si texture; Solar energy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; LIGHT REFLECTION; METALLIZING; PHOTOVOLTAIC CELLS; SCANNING ELECTRON MICROSCOPY; SOLAR ENERGY;

EID: 17644420343     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.07.040     Document Type: Conference Paper
Times cited : (80)

References (28)
  • 1
    • 0025673141 scopus 로고
    • Light trapping in textured solar-cells
    • P. Campbell Light trapping in textured solar-cells Sol. Energy Mater. 21 1990 165 172
    • (1990) Sol. Energy Mater. , vol.21 , pp. 165-172
    • Campbell, P.1
  • 2
    • 0027726661 scopus 로고
    • Enhancement of light-absorption from randomizing and geometric textures
    • P. Campbell Enhancement of light-absorption from randomizing and geometric textures J. Opt. Soc. Am. B 10 1993 2410 2415
    • (1993) J. Opt. Soc. Am. B , vol.10 , pp. 2410-2415
    • Campbell, P.1
  • 3
    • 0035203023 scopus 로고    scopus 로고
    • High performance light trapping textures for monocrystalline silicon solar cells
    • P. Campbell, and M.A. Green High performance light trapping textures for monocrystalline silicon solar cells Sol. Energy Mater. Sol. Cells 65 2001 369 375
    • (2001) Sol. Energy Mater. Sol. Cells , vol.65 , pp. 369-375
    • Campbell, P.1    Green, M.A.2
  • 7
    • 17644416870 scopus 로고    scopus 로고
    • Method for the wet chemical pyramidal texture etching of silicon surfaces, USA Patent 6451218
    • K. Holdermann, Method for the wet chemical pyramidal texture etching of silicon surfaces, USA Patent 6451218, 2002.
    • (2002)
    • Holdermann, K.1
  • 8
  • 10
    • 0037473602 scopus 로고    scopus 로고
    • Texturization of monocrystalline silicon with tribasic sodium phosphate
    • Z. Xi, D. Yang, and D. Que Texturization of monocrystalline silicon with tribasic sodium phosphate Sol. Energy Mater. Sol. Cells 77 2003 255 263
    • (2003) Sol. Energy Mater. Sol. Cells , vol.77 , pp. 255-263
    • Xi, Z.1    Yang, D.2    Que, D.3
  • 11
    • 0033900655 scopus 로고    scopus 로고
    • Investigation of texturization for crystalline silicon solar cells with sodium carbonate solutions
    • Y. Nishimoto, and K. Namba Investigation of texturization for crystalline silicon solar cells with sodium carbonate solutions Sol. Energy Mater. Sol. Cells 61 2000 393 402
    • (2000) Sol. Energy Mater. Sol. Cells , vol.61 , pp. 393-402
    • Nishimoto, Y.1    Namba, K.2
  • 12
    • 0033138335 scopus 로고    scopus 로고
    • Micropyramidal hillocks on KOH etched {1 0 0} silicon surfaces: Formation prevention and removal
    • H. Schröder, E. Obermeier, and A. Steckenborn Micropyramidal hillocks on KOH etched {1 0 0} silicon surfaces formation prevention and removal J. Micromech. Microeng. 9 1999 139 145
    • (1999) J. Micromech. Microeng. , vol.9 , pp. 139-145
    • Schröder, H.1    Obermeier, E.2    Steckenborn, A.3
  • 13
    • 0343773238 scopus 로고    scopus 로고
    • Anisotropic etching of {1 0 0} and {1 1 0} planes in (1 0 0) silicon
    • O. Powell, and H.B. Harrison Anisotropic etching of {1 0 0} and {1 1 0} planes in (1 0 0) silicon J. Micromech. Microeng. 11 2001 217 220
    • (2001) J. Micromech. Microeng. , vol.11 , pp. 217-220
    • Powell, O.1    Harrison, H.B.2
  • 14
    • 0029373771 scopus 로고
    • Inhibition of pyramid formation in the etching of Si p〈1 0 0〉 in aqueous potassium hydroxide-isopropanol
    • S.A. Campbell, K. Cooper, L. Dixon, R. Earwaker, S.N. Port, and D.J. Schiffrin Inhibition of pyramid formation in the etching of Si p〈1 0 0〉 in aqueous potassium hydroxide-isopropanol J. Micromech. Microeng. 5 1995 209 218
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 209-218
    • Campbell, S.A.1    Cooper, K.2    Dixon, L.3    Earwaker, R.4    Port, S.N.5    Schiffrin, D.J.6
  • 15
    • 0037339987 scopus 로고    scopus 로고
    • Reconstruction of the surface topography of randomly textured silicon
    • G. Kuchler, and R. Brendel Reconstruction of the surface topography of randomly textured silicon Prog. Photovoltaics: Res. Appl. 11 2003 89 95
    • (2003) Prog. Photovoltaics: Res. Appl. , vol.11 , pp. 89-95
    • Kuchler, G.1    Brendel, R.2
  • 17
    • 0033354121 scopus 로고    scopus 로고
    • Angle-dependent reflectance measurements on photovoltaic materials and solar cells
    • A. Parretta, A. Sarno, P. Tortora, H. Yakubu, P. Maddalena, J. Zhao, and A. Wang Angle-dependent reflectance measurements on photovoltaic materials and solar cells Opt. Comm 172 1999 139 151
    • (1999) Opt. Comm , vol.172 , pp. 139-151
    • Parretta, A.1    Sarno, A.2    Tortora, P.3    Yakubu, H.4    Maddalena, P.5    Zhao, J.6    Wang, A.7
  • 18
    • 0019569241 scopus 로고
    • Optical diffraction technique for determination of crystal orientations
    • B.L. Sopori Optical diffraction technique for determination of crystal orientations Appl. Opt. 20 1981 1758 1763
    • (1981) Appl. Opt. , vol.20 , pp. 1758-1763
    • Sopori, B.L.1
  • 19
    • 0024092779 scopus 로고
    • Reflection characteristics of textured polycrystalline silicon substrates for solar cells
    • B.L. Sopori Reflection characteristics of textured polycrystalline silicon substrates for solar cells Sol. Cells 25 1988 15 26
    • (1988) Sol. Cells , vol.25 , pp. 15-26
    • Sopori, B.L.1
  • 20
    • 0342505584 scopus 로고
    • Use of optical scattering to characterize dislocations in semiconductors
    • B.L. Sopori Use of optical scattering to characterize dislocations in semiconductors Appl. Opt. 27 1988 4676 4683
    • (1988) Appl. Opt. , vol.27 , pp. 4676-4683
    • Sopori, B.L.1
  • 21
    • 0024088908 scopus 로고
    • The principle of dislocation analysis by coherent optical scattering from a defect-etched surface
    • B.L. Sopori The principle of dislocation analysis by coherent optical scattering from a defect-etched surface J. Electrochem. Soc. 135 1988 2601 2606
    • (1988) J. Electrochem. Soc. , vol.135 , pp. 2601-2606
    • Sopori, B.L.1
  • 22
    • 0033874781 scopus 로고    scopus 로고
    • High-speed mapping of grown-in defects and their influence in large-area silicon photovoltaic devices
    • B. Sopori, C. Wei, Z. Yi, and J. Madjdpour High-speed mapping of grown-in defects and their influence in large-area silicon photovoltaic devices J. Cryst. Growth 210 2000 346 350
    • (2000) J. Cryst. Growth , vol.210 , pp. 346-350
    • Sopori, B.1    Wei, C.2    Yi, Z.3    Madjdpour, J.4
  • 23
    • 0009059839 scopus 로고    scopus 로고
    • Principles and applications of reflectometery in PV manufacturing
    • Lakewood, Colorado, 14-17 October NCPV/CP-520-31003
    • B. Sopori, Y. Zhang, R. Faison, J. Madjdpour, Principles and applications of reflectometery in PV manufacturing, Proceedings of the NCPV Program Review Meeting, Lakewood, Colorado, 14-17 October 2001, NCPV/CP-520-31003.
    • (2001) Proceedings of the NCPV Program Review Meeting
    • Sopori, B.1    Zhang, Y.2    Faison, R.3    Madjdpour, J.4
  • 25
    • 17644423564 scopus 로고    scopus 로고
    • Método óptico y dispositivo para la cuantificación de la textura en células fotovoltaicas, Patent applications no. 200301666 and PCT/ES2004/070050. Spanish Patent Office
    • C. Zaldo, J.M. Albella, E. Forniés, Método óptico y dispositivo para la cuantificación de la textura en células fotovoltaicas, Patent applications no. 200301666 and PCT/ES2004/070050. Spanish Patent Office, 2003 and 2004.
    • (2003)
    • Zaldo, C.1    Albella, J.M.2    Forniés, E.3
  • 27
    • 0001397243 scopus 로고    scopus 로고
    • 19.8% efficient "honeycomb" textured multicrystalline and 24.4% monocrystalline silicon solar cells
    • J. Zhao, A. Wang, M.A. Green, and F. Ferrazza 19.8% efficient "honeycomb" textured multicrystalline and 24.4% monocrystalline silicon solar cells Appl. Phys. Lett. 73 1998 1991 1993
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 1991-1993
    • Zhao, J.1    Wang, A.2    Green, M.A.3    Ferrazza, F.4
  • 28
    • 0028510757 scopus 로고
    • Morphology of etch hillock defects created during anisotropic etching of silicon
    • S. Tan, M. Reed, H. Han, and R. Boudreau Morphology of etch hillock defects created during anisotropic etching of silicon J. Micromech. Microeng. 4 1994 147 155
    • (1994) J. Micromech. Microeng. , vol.4 , pp. 147-155
    • Tan, S.1    Reed, M.2    Han, H.3    Boudreau, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.