Observation of domain structures in Bi-based CaBi4Ti 4O15 thin films by scanning force microscopy

Ferroelectrics

Volumn 291, Issue , 2003, Pages 49-54

  Fu, Desheng ^a   Suzuki, Kazuyuki ^a   Kato, Kazumi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Domains; Layered ferroelectrics; Piezoelectric; Scanning force microscopy; Thin films

Indexed keywords

DEPOSITION; MAGNETIC DOMAINS; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; THIN FILMS;

DOMAINS; LAYERED FERROELECTRICS; PIEZOELECTRICS; SCANNING FORCE MICROSCOPY;

PIEZOELECTRIC MATERIALS;

EID: 17544364925     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190390222547     Document Type: Conference Paper

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