Systematic errors of noise parameter determination caused by imperfect source impedance maeasurement

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 2, 2005, Pages 696-700

  Wiatr, Wojciech ^a   Walker, David K ^b  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Amplifiers; Error analysis; Microwave field effect transistors; Modeling; Network analyzer; Noise; Parameter estimation; Residual errors

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; ELECTRIC NETWORK ANALYZERS; ERROR ANALYSIS; HIGH ELECTRON MOBILITY TRANSISTORS; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; MATRIX ALGEBRA; MICROWAVE AMPLIFIERS; PARAMETER ESTIMATION; SPURIOUS SIGNAL NOISE; VECTORS;

MICROWAVE FIELD EFFECT TRANSISTORS; NOISE PARAMETER DETERMINATION; PSEUDOMORPHIC HIGH ELECTRON MOBILITY TRANSISTORS; RESIDUAL ERRORS; SOURCE IMPEDANCE MEASUREMENT;

ELECTRIC IMPEDANCE MEASUREMENT;

EID: 17444372663     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.843534     Document Type: Article

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