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Volumn , Issue , 1998, Pages 62-64

Accuracy improvements in microwave noise parameter determination

Author keywords

[No Author keywords available]

Indexed keywords

ITERATIVE METHODS; MEASUREMENT ERRORS; METADATA; NOISE FIGURE; RANDOM ERRORS; REFLECTION;

EID: 79951776994     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1998.327278     Document Type: Conference Paper
Times cited : (6)

References (12)
  • 3
    • 0018518499 scopus 로고
    • On the determination of device noise and gain panmeters
    • Sept
    • M. Sannino. 'On the determination of device noise and gain panmeters', Proc. IEEE, vol67. Sept 1979. pp 1364-1366
    • (1979) Proc. IEEE , vol.67 , pp. 1364-1366
    • Sannino, M.1
  • 4
    • 0018480475 scopus 로고
    • An improved computational method for noise parameter measurement
    • June
    • M. Mitama, H. Katho. 'An improved computational method for noise parameter measurement'. IEEE T m . MTT, vol. MTT-27, June 1979
    • (1979) IEEE Tm . MTT , vol.MTT-27
    • Mitama, M.1    Katho, H.2
  • 5
    • 85050543708 scopus 로고
    • Accuracy improvements in microwave noise parameter measurements: IEEE MTT
    • December Aug 1969 pp. 612-615 pp. 1973-1978
    • A.C. Davidson et al. 'Accuracy improvements in microwave noise parameter measurements: IEEE MTT, vol. MTT-37, December 1989. Institution of Electrical Engeneen. 1989. pp176-208 IEEE, VOI. 57. pp. 1461-1462. Aug 1969 pp. 612-615 pp. 1973-1978
    • (1989) Institution of Electrical Engeneen, 1989 pp176-208 IEEE, VOI , vol.57 MTT-37 , pp. 1461-1462
    • Davidson, A.C.1
  • 10
    • 0004161838 scopus 로고
    • second edition, Cambridge Univenity Press
    • W.H. Press et al., 'Numerical recipes in C'. second edition, Cambridge Univenity Press, 1992, pp. 676-680
    • (1992) Numerical Recipes in C , pp. 676-680
    • Press, W.H.1
  • 11
    • 85050551647 scopus 로고    scopus 로고
    • Computer-aided determination of microwave two-port noise parameters
    • September
    • G. Caruso, M. Sannino, Computer-aided determination of microwave two-port noise parameters', IEEE MTT, vol. MTT-26. September
    • IEEE MTT MTT-26
    • Caruso, G.1    Sannino, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.