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Volumn 2, Issue , 2000, Pages 539-542

A method for evaluation of uncertainties of noise parameter measurement

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; ONLINE SYSTEMS; PARAMETER ESTIMATION; RADAR; SENSITIVITY ANALYSIS; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 84963827933     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIKON.2000.913990     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 1
    • 0026821187 scopus 로고
    • Fully automated on-wafer noise characterization of GaAs MESFET's and HEMT's
    • J. W. Archer, R. A. Batchelor. Fully automated on-wafer noise characterization of GaAs MESFET's and HEMT's. IEEE Trans. Microwave Theory Tech. 40 (2), 209-216 (1992).
    • (1992) IEEE Trans. Microwave Theory Tech. , vol.40 , Issue.2 , pp. 209-216
    • Archer, J.W.1    Batchelor, R.A.2
  • 2
    • 0030258747 scopus 로고    scopus 로고
    • Microwave noise characterization of two-port devices using an uncalibrated tuner
    • R. Benelbar, B. Huyart, R. G. Bosisio. Microwave noise characterization of two-port devices using an uncalibrated tuner. IEEE Trans. Microwave Theory Tech. 44 (10), 1725-1728 (1996).
    • (1996) IEEE Trans. Microwave Theory Tech. , vol.44 , Issue.10 , pp. 1725-1728
    • Benelbar, R.1    Huyart, B.2    Bosisio, R.G.3
  • 3
    • 0032206071 scopus 로고    scopus 로고
    • Improved impedance-pattern generation for automatic noise-parameter determination
    • S. Van den Bosch, L. Martens. Improved impedance-pattern generation for automatic noise-parameter determination. IEEE Trans. Microwave Theory Tech. 46 (11), 1673-1678 (1998).
    • (1998) IEEE Trans. Microwave Theory Tech. , vol.46 , Issue.11 , pp. 1673-1678
    • Van Den Bosch, S.1    Martens, L.2
  • 4
    • 0024888749 scopus 로고
    • Accuracy improvements in microwave measurement of noise parameterss
    • A. C. Davidson, B. W. Leake, E. W. Strid. Accuracy improvements in microwave measurement of noise parameterss. IEEE Trans. Microwave Theory Tech. MTT-37, 1973-1977 (1989).
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.MTT-37 , pp. 1973-1977
    • Davidson, A.C.1    Leake, B.W.2    Strid, E.W.3
  • 5
    • 84939335903 scopus 로고
    • Errors in measurement of microwave transistor noise parameters
    • G. Mamola, M. Sannino. Errors in measurement of microwave transistor noise parameters. Alta Frequenza XLII (10), 551-556 (1973).
    • (1973) Alta Frequenza , vol.42 , Issue.10 , pp. 551-556
    • Mamola, G.1    Sannino, M.2
  • 6
    • 84963901072 scopus 로고    scopus 로고
    • Experimental verification of measurement uncertainties of multi-state radiometer system
    • Warszawa
    • M. Schmidt-Szałowski. Experimental verification of measurement uncertainties of multi-state radiometer system, pages 331-335. MIKON'96, Warszawa, 1996.
    • (1996) MIKON'96 , pp. 331-335
    • Schmidt-Szałowski, M.1
  • 7
    • 84897515065 scopus 로고    scopus 로고
    • An improved method for simultaneous small-signal and noise characterization of two-ports using multi-state radiometer
    • Muenchen
    • M. Schmidt-Szałowski, W. Wiatr.An improved method for simultaneous small-signal and noise characterization of two-ports using multi-state radiometer, pages 61-64. EuMC'99, Muenchen, 1999.
    • (1999) EuMC'99 , pp. 61-64
    • Schmidt-Szałowski, M.1    Wiatr, W.2
  • 8
    • 0002727477 scopus 로고
    • Guidelines for evaluating and expressing the uncertainties of NIST measurement results
    • B. N. Taylor, C. E. Kuyatt. Guidelines for evaluating and expressing the uncertainties of NIST measurement results. NIST Technical Note 1297 (1994).
    • (1994) NIST Technical Note , pp. 1297
    • Taylor, B.N.1    Kuyatt, C.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.