Comments on "Cryogenic Noise Parameter Measurements of Microwave Devices"

IEEE Transactions on Instrumentation and Measurement

Volumn 53, Issue 2, 2004, Pages 619-

  Wiatr, Wojciech ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 11144357883     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.823649     Document Type: Letter

References (6)

1. I. Rolfes, T. Musch, and B. Schiek, "Cryogenic Noise Parameter Measurements of Microwave Devices," IEEE Trans. Instrum. Meas., vol. 50, pp. 373-376, Apr. 2001.
2. W. Wiatr, "Characterization of radiometer using eight-term linear model," IEEE Trans. Instrum. Meas., vol. 44, pp. 343-346, Apr. 1995.
3. _, "Multistate radiometry: Noise de-embedding and 'Unterminating'," IEEE Trans. Instrum. Meas., vol. 46, pp. 503-506, Apr. 1997.
4. W. Wiatr and M. Schmidt-Szalowski, "A simplified procedure for impedance measurement using multi-state radiometer," in Proc. 27th European Microwave Conf., Jerusalem, Israel, Sept. 1997, pp. 897-902.
5. W. Wiatr, "High accuracy characterization of two-ports in noise measurement system," in Proc. MIOP, Sindelfingen, Germany, 1993, pp. 65-69.
6. W. Wiatr and M. Schmidt-Szalowski, "The multistate radiometer: A novel means for broadband noise and small-signal characterization of microwave semiconductor devices," in Proc. 49th ARFTG Conf. Dig., Denver, CO, June 1997, pp. 171-180.