Atomic and electronic structures of Cu/sapphire interfaces by HRTEM and EELS analyses

Materials Science Forum

Volumn 475-479, Issue V, 2005, Pages 3859-3862

  Sasaki, T ^a   Mizoguchi, T ^a   Matsunaga, K ^a   Tanaka, S ^b   Yamamoto, T ^a   Kohyama, M ^b   Ikuhara, Y ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Cu sapphire interfaces; Electron energy loss spectroscopy (EELS); High resolution transmission electron microscopy (HRTEM)

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); PULSED LASER DEPOSITION; SAPPHIRE; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL BONDING STATES; CU/SAPPHIRE INTERFACES; INTERFACIAL STRUCTURES; ORIENTATION RELATIONSHIPS (OR);

COPPER;

EID: 17144430146     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-960-1.3859     Document Type: Conference Paper

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