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Volumn 5, Issue , 2004, Pages 254-263

Simplified two-dimensional quantification of the microdefect distributions in silicon crystals grown by the Czochralski process

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); NUCLEATION; POINT DEFECTS; PRECIPITATION (CHEMICAL); THERMAL EFFECTS;

EID: 17144365055     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.