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Volumn 180-181, Issue , 2004, Pages 33-40

Determination of intrinsic stresses in textured and epitaxial TiN thin films deposited by dual ion beam sputtering

Author keywords

Epitaxy; Ion beam sputtering; Residual stress; Texture; TiN

Indexed keywords

DEPOSITION; ION BEAMS; SILICON WAFERS; SINGLE CRYSTALS; SPUTTERING; STRAIN RATE; THERMAL STRESS; THIN FILMS; X RAY DIFFRACTION;

EID: 17044442560     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2003.10.137     Document Type: Article
Times cited : (22)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.