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Volumn 180-181, Issue , 2004, Pages 33-40
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Determination of intrinsic stresses in textured and epitaxial TiN thin films deposited by dual ion beam sputtering
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Author keywords
Epitaxy; Ion beam sputtering; Residual stress; Texture; TiN
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Indexed keywords
DEPOSITION;
ION BEAMS;
SILICON WAFERS;
SINGLE CRYSTALS;
SPUTTERING;
STRAIN RATE;
THERMAL STRESS;
THIN FILMS;
X RAY DIFFRACTION;
HYDROSTATIC STRESSES;
INTRINSIC STRESSES;
TITANIUM NITRIDE;
SPUTTERING;
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EID: 17044442560
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2003.10.137 Document Type: Article |
Times cited : (22)
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References (23)
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