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Applied Physics Letters

Volumn 86, Issue 3, 2005, Pages 1-3

Few electrons injection in silicon nanocrystals probed by ultrahigh vacuum atomic force microscopy

(5) Decossas, S a Vitiello, J a Baron, T a Mazen, F b Gidon, S a

a CEA LETI (France)

b INSTITUT DES NANOTECHNOLOGIES DE LYON (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRIC CHARGE; ELECTRIC FIELDS; ELECTROSTATICS; NATURAL FREQUENCIES; NONVOLATILE STORAGE; OPTIMIZATION; OSCILLATIONS; SEMICONDUCTING SILICON; SILICA; ULTRAHIGH VACUUM;

ELECTRONS INJECTION; INJECTION TIME; NONVOLATILE MEMORIES (NVM); SEMICONDUCTOR NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 17044427140 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1829779 Document Type: Article

Times cited : (5)

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