-
1
-
-
0001022191
-
Process considerations for critical features in high areal density thin film magnetoresistive heads: A review
-
R.E. Fontana Jr., S.A. MacDonald, H.A.A. Santini, and C. Tsang Process considerations for critical features in high areal density thin film magnetoresistive heads: a review IEEE Trans. Magnet. 35 1999 806 811
-
(1999)
IEEE Trans. Magnet.
, vol.35
, pp. 806-811
-
-
Fontana Jr., R.E.1
MacDonald, S.A.2
Santini, H.A.A.3
Tsang, C.4
-
2
-
-
1842730227
-
Modeling of temperature rise in Giant Magnetoresistive (GMR) sensor during an Electrostatic Discharge (ESD) event
-
Y. Yang, S.M. Sadeghipour, M. Asheghi, Modeling of temperature rise in Giant Magnetoresistive (GMR) sensor during an Electrostatic Discharge (ESD) event, in: Proceeding of ASME Summer Heat Transfer Conference, HT2003-47266, 2003
-
(2003)
Proceeding of ASME Summer Heat Transfer Conference
, vol.HT2003-47266
-
-
Yang, Y.1
Sadeghipour, S.M.2
Asheghi, M.3
-
3
-
-
84975354333
-
RF sputtered aluminum oxide films on silicon
-
C.A. Salama RF sputtered aluminum oxide films on silicon J. Electrochem. Soc. 117 1970 913 917
-
(1970)
J. Electrochem. Soc.
, vol.117
, pp. 913-917
-
-
Salama, C.A.1
-
4
-
-
0019183273
-
Origins and minimization of defects in sputtered thin films
-
R.S. Nowicki Origins and minimization of defects in sputtered thin films Solid State Technol. 23 1980 83 88
-
(1980)
Solid State Technol.
, vol.23
, pp. 83-88
-
-
Nowicki, R.S.1
-
6
-
-
0033731071
-
Effect of the pressure of sputtering atmosphere on the physical properties of amorphous aluminum oxide films
-
Y. Kijima, and T. Hanada Effect of the pressure of sputtering atmosphere on the physical properties of amorphous aluminum oxide films J. Mater. Sci. 35 2000 2193 2199
-
(2000)
J. Mater. Sci.
, vol.35
, pp. 2193-2199
-
-
Kijima, Y.1
Hanada, T.2
-
7
-
-
0035385968
-
A combined experimental and numerical study of temperature rise in GMR sensors due to self-heating
-
Y.S. Ju, R. Xu, X. Wu, N. Smith, R. Fontana, W. Lee, K. Carey, M. Ho, D. Hsiao, and B. Gurney A combined experimental and numerical study of temperature rise in GMR sensors due to self-heating IEEE Trans. Magnet. 37 2001 1701 1703
-
(2001)
IEEE Trans. Magnet.
, vol.37
, pp. 1701-1703
-
-
Ju, Y.S.1
Xu, R.2
Wu, X.3
Smith, N.4
Fontana, R.5
Lee, W.6
Carey, K.7
Ho, M.8
Hsiao, D.9
Gurney, B.10
-
8
-
-
0031355934
-
Three-dimensional simulation of magnetoresistive heat temperature during ESD event
-
C. Chang, Three-dimensional simulation of magnetoresistive heat temperature during ESD event, in: Proceedings of EOS/ESD Symposium, 1997, pp. 405-411
-
(1997)
Proceedings of EOS/ESD Symposium
, pp. 405-411
-
-
Chang, C.1
-
9
-
-
0025481963
-
Finite element analysis of planar stress anisotropy and thermal behavior in thin films
-
K. Young Finite element analysis of planar stress anisotropy and thermal behavior in thin films IBM J. Res. Develop. 34 1990 706 717
-
(1990)
IBM J. Res. Develop.
, vol.34
, pp. 706-717
-
-
Young, K.1
-
10
-
-
0029478201
-
ESD failure mechanisms of inductive and magentoresistive recoding heads
-
A. Wallash, T. Hughbanks, S. Voldman, ESD failure mechanisms of inductive and magentoresistive recoding heads, in: Proceedings of EOS/ESD Symposium, 1995, pp. 322-330
-
(1995)
Proceedings of EOS/ESD Symposium
, pp. 322-330
-
-
Wallash, A.1
Hughbanks, T.2
Voldman, S.3
-
12
-
-
17044363997
-
-
MEMS Clearing House, 23 August 2002. Available from: < www.memsnet.org
-
(2002)
-
-
-
14
-
-
0033534934
-
Thermal characterization of anisotropic thin dielectric films using harmonic Joule heating
-
Y.S. Ju, K. Kurabayashi, and K.E. Goodson Thermal characterization of anisotropic thin dielectric films using harmonic Joule heating Thin Solid Films (Elsevier) 339 1999 160 164
-
(1999)
Thin Solid Films (Elsevier)
, vol.339
, pp. 160-164
-
-
Ju, Y.S.1
Kurabayashi, K.2
Goodson, K.E.3
-
15
-
-
1942504678
-
-
Ph.D. thesis, Massachusetts Institute of Technology, Cambridge, MA
-
K.E. Goodson, Thermal conduction in microelectronic circuits, Ph.D. thesis, Massachusetts Institute of Technology, Cambridge, MA, 1993, pp. 112-116
-
(1993)
Thermal Conduction in Microelectronic Circuits
, pp. 112-116
-
-
Goodson, K.E.1
-
17
-
-
0031998367
-
Temperature dependent thermal conductivity of single-crystal silicon layers in SOI substrates
-
M. Asheghi, M.N. Touzelbaev, K.E. Goodson, Y.K. Leung, and S.S. Wong Temperature dependent thermal conductivity of single-crystal silicon layers in SOI substrates ASME J. Heat Transfer 120 1998 30 36
-
(1998)
ASME J. Heat Transfer
, vol.120
, pp. 30-36
-
-
Asheghi, M.1
Touzelbaev, M.N.2
Goodson, K.E.3
Leung, Y.K.4
Wong, S.S.5
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