-
1
-
-
0029275793
-
Determination of the Heat Capacity of CMOS Layers for Optimal CMOS Sensor Design
-
Arx, M. Paul, O., and Baltes, H., 1995, "Determination of the Heat Capacity of CMOS Layers for Optimal CMOS Sensor Design," Sensors and Actuators A, Vol. 46-47, pp. 428-31.
-
(1995)
Sensors and Actuators A
, vol.46-47
, pp. 428-431
-
-
Arx, M.1
Paul, O.2
Baltes, H.3
-
2
-
-
0037091483
-
Thermal Conduction in Doped Single-Crystal Silicon Films
-
Asheghi, M., Kurabayashi, K., Kasnavi, R. and K.E. Goodson, 2002, "Thermal Conduction in Doped Single-Crystal Silicon Films," Journal of Applied Physics, Vol. 91, No. 8, pp. 5079-5088.
-
(2002)
Journal of Applied Physics
, vol.91
, Issue.8
, pp. 5079-5088
-
-
Asheghi, M.1
Kurabayashi, K.2
Kasnavi, R.3
Goodson, K.E.4
-
3
-
-
0000864408
-
Phonon-boundary Scattering in Thin Silicon Layers
-
Asheghi, M., Leung, Y.K., Wong, S.S., and Goodson, K.E., 1997, "Phonon-boundary Scattering in Thin Silicon Layers," Applied Physics Letters, Vol. 71, PP. 1798-1800.
-
(1997)
Applied Physics Letters
, vol.71
, pp. 1798-1800
-
-
Asheghi, M.1
Leung, Y.K.2
Wong, S.S.3
Goodson, K.E.4
-
5
-
-
1942536081
-
Thermal Property Measurement of Thin Aluminum Oxide Layers for Giant Magnetoresistive (GMR) Head Application
-
November 15-21, 2003, Washington, D.C., USA
-
Behkam, B., Yang Y., and Asheghi, M, 2003, "Thermal Property Measurement of Thin Aluminum Oxide Layers for Giant Magnetoresistive (GMR) Head Application," ASME International Mechanical Engineering Congress & Exposition, IMECE-41626, November 15-21, 2003, Washington, D.C., USA.
-
(2003)
ASME International Mechanical Engineering Congress & Exposition
, vol.IMECE-41626
-
-
Behkam, B.1
Yang, Y.2
Asheghi, M.3
-
6
-
-
36549099049
-
Thermal Conductivity Measurement from 30 to 750 K: The 3 Omega Method
-
Cahill, D. G., 1990, "Thermal Conductivity Measurement from 30 to 750 K: The 3 Omega Method," Review of Scientific Instrument, Vol. 61, pp. 802-8.
-
(1990)
Review of Scientific Instrument
, vol.61
, pp. 802-808
-
-
Cahill, D.G.1
-
7
-
-
0031268714
-
Experimental and Theoretical Investigations of Laser-Induced Crystallization and Amorphization in Phase-Change Optical Recording Media
-
Chubing, P., Lu, C., and Mansuripur, M. J., 1997, "Experimental and Theoretical Investigations of Laser-Induced Crystallization and Amorphization in Phase-Change Optical Recording Media," J. App. Phys, Vol. 82, No. 9, pp.4183-91.
-
(1997)
J. App. Phys
, vol.82
, Issue.9
, pp. 4183-4191
-
-
Chubing, P.1
Lu, C.2
Mansuripur, M.J.3
-
8
-
-
0001022191
-
Process Considerations for Critical Features in High Areal Density Thin Film Magnetoresistive Heads: A Review
-
Fontana, R. E., MacDonald, S. A., Santini, A. A., and Tsang, C., 1999, "Process Considerations for Critical Features in High Areal Density Thin Film Magnetoresistive Heads: a Review," IEEE Transaction Magnetism, Vol. 35, pp. 806-811.
-
(1999)
IEEE Transaction Magnetism
, vol.35
, pp. 806-811
-
-
Fontana, R.E.1
Macdonald, S.A.2
Santini, A.A.3
Tsang, C.4
-
9
-
-
0028427664
-
Prediction and Measurement of the Thermal Conductivity of Amorphous Dielectric Layers
-
Goodson, K. E., Flik, M. I., Su, L. T., and Antoniadis, D. A., 1994, "Prediction and Measurement of the Thermal Conductivity of Amorphous Dielectric Layers," ASME Journal of Heat Transfer, Vol. 116, No. 2, pp.317-24.
-
(1994)
ASME Journal of Heat Transfer
, vol.116
, Issue.2
, pp. 317-324
-
-
Goodson, K.E.1
Flik, M.I.2
Su, L.T.3
Antoniadis, D.A.4
-
10
-
-
1842786262
-
An FEM Analysis of the Temperature Rise Distribution in a GMR Head due to the Sense Current and Contact Resistance
-
Imamura T., Kannai, H., and Toda, J., 1999, "An FEM Analysis of the Temperature Rise Distribution in a GMR Head due to the Sense Current and Contact Resistance," IEEE Transaction Magnetism, Vol. 33, pp. 3130-32.
-
(1999)
IEEE Transaction Magnetism
, vol.33
, pp. 3130-3132
-
-
Imamura, T.1
Kannai, H.2
Toda, J.3
-
11
-
-
0001292732
-
Transient Thermoreflectance from Thin Metal Films
-
Paddock, C. A., and Eesley, G. L., 1986, "Transient Thermoreflectance from Thin Metal Films," Journal of Applied Physics, Vol. 60, No. 1, pp. 285-90.
-
(1986)
Journal of Applied Physics
, vol.60
, Issue.1
, pp. 285-290
-
-
Paddock, C.A.1
Eesley, G.L.2
-
12
-
-
18244390620
-
Thermal Conductivity of Heavily Doped Low-Pressure Chemical Vapor Deposited Polycrystalline Silicon Films
-
Tai, Y. C., Mastrangelo, C. H., and Muller, R. S., 1988, "Thermal Conductivity of Heavily Doped Low-Pressure Chemical Vapor Deposited Polycrystalline Silicon Films", Journal of Applied Physics, Vol. 63, No. 5, pp. 1442-47.
-
(1988)
Journal of Applied Physics
, vol.63
, Issue.5
, pp. 1442-1447
-
-
Tai, Y.C.1
Mastrangelo, C.H.2
Muller, R.S.3
-
13
-
-
0032115636
-
ESD Induced Pinned Layer Reversal in Spin-Value GMR Heads
-
Takahashi, M., Maeda, T., Inage, K., Sakai, M., Morita, H., and Matsuzaki, M., 1998, "ESD Induced Pinned Layer Reversal in Spin-Value GMR Heads," IEEE Transaction Magnetism, Vol. 34, No.4, pp. 1522-24.
-
(1998)
IEEE Transaction Magnetism
, vol.34
, Issue.4
, pp. 1522-1524
-
-
Takahashi, M.1
Maeda, T.2
Inage, K.3
Sakai, M.4
Morita, H.5
Matsuzaki, M.6
-
14
-
-
0032119751
-
Magnetic Changes in GMR Heads Caused by Electrostatic Discharge
-
Wallash, A., and Kim, J.K., 2000, "Magnetic Changes in GMR Heads Caused by Electrostatic Discharge," IEEE Transaction Magnetism, Vol. 36, pp. 1519-21.
-
(2000)
IEEE Transaction Magnetism
, vol.36
, pp. 1519-1521
-
-
Wallash, A.1
Kim, J.K.2
-
15
-
-
1842629546
-
Thermal Characterization of the 144 nm GMR Layers using Microfabricated Suspended Structures
-
Las Vegas, Nevada, USA, July 21-23, 2003
-
Zhang, S., Yang, Y., Sadeghipour, S. M., and Asheghi, M., 2003, "Thermal Characterization of the 144 nm GMR Layers using Microfabricated Suspended Structures," ASME Summer Heat Transfer Conference, HT2003-47270. Las Vegas, Nevada, USA, July 21-23, 2003.
-
(2003)
ASME Summer Heat Transfer Conference
, vol.HT2003-47270
-
-
Zhang, S.1
Yang, Y.2
Sadeghipour, S.M.3
Asheghi, M.4
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