STM and FIB nano-structuration of surfaces to localise InAs/InP(0 0 1) quantum dots

Applied Surface Science

Volumn 226, Issue 1-3 SPEC. ISS., 2004, Pages 31-35

  Kapsa, J ^a   Robach, Y ^a   Hollinger, G ^a   Gendry, M ^a   Gierak, J ^b   Mailly, D ^b  

^a ECOLE CENTRALE DE LYON   (France)

^b UNIV PARIS SUD   (France)

Author keywords

FIB; Nanotechnology; Quantum dot; Semi conducting III V materials; STM

Indexed keywords

DEGRADATION; FABRICATION; ION BEAMS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM PHOSPHIDE;

ELASTIC RELAXATION; ELASTICALLY STRAINED EPILAYERS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 1642524528     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2003.11.006     Document Type: Conference Paper

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