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Volumn 772, Issue , 2003, Pages 23-34
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Carbon-Nanotube Engineering for Probes and Tweezers Operating in Scanning Probe Microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
DEPOSITION;
ELECTRIC BREAKDOWN;
ELECTRON BEAMS;
LIGHT EMISSION;
NANOTECHNOLOGY;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
ELECTRON ABLATION;
SCANNING PROBE MICROSCOPES (SPM);
CARBON NANOTUBES;
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EID: 1642500283
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-772-m8.4 Document Type: Conference Paper |
Times cited : (1)
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References (16)
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