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Volumn 110, Issue 1-3, 2004, Pages 294-300

A silicon integrated opto-electro-mechanical displacement sensor

Author keywords

Diffraction gratings; Displacement sensors; OptoASICs

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIFFRACTION; DIFFRACTION GRATINGS; DIGITAL CIRCUITS; ETCHING; HOLOGRAPHY; OPTICAL VARIABLES MEASUREMENT; PHOTODIODES; PHOTOLITHOGRAPHY; REFLECTION; SEMICONDUCTOR LASERS; SILICON;

EID: 1642484925     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2003.10.067     Document Type: Conference Paper
Times cited : (23)

References (10)
  • 1
    • 0006915066 scopus 로고
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    • Teimel A. Technology and applications of grating interferometers in high - precision measurement. Precision Eng. 14:1992;147-154.
    • (1992) Precision Eng. , vol.14 , pp. 147-154
    • Teimel, A.1
  • 2
    • 0029304150 scopus 로고
    • Sensing means and sensor shells: A new method of comparative study of piezoelectric, piezoresistive, electrostatic, magnetic and optical sensors
    • Tabib-Azar M., Garcia-Valenzuela A. Sensing means and sensor shells: a new method of comparative study of piezoelectric, piezoresistive, electrostatic, magnetic and optical sensors. Sens. Actuators A. 48:1995;87-100.
    • (1995) Sens. Actuators A , vol.48 , pp. 87-100
    • Tabib-Azar, M.1    Garcia-Valenzuela, A.2
  • 3
    • 0026898298 scopus 로고
    • Industrial CMOS technology for the integration of optical metrology systems (photoASICs)
    • Kramer J., Seitz P., Baltes H. Industrial CMOS technology for the integration of optical metrology systems (photoASICs). Sens. Actuators A. 34:1992;21-30.
    • (1992) Sens. Actuators A , vol.34 , pp. 21-30
    • Kramer, J.1    Seitz, P.2    Baltes, H.3
  • 5
    • 0036132853 scopus 로고    scopus 로고
    • Compact diffractive interferometric displacement sensor in reflection
    • Jourlin Y., Jay J., Parriaux O. Compact diffractive interferometric displacement sensor in reflection. Precision Eng. 26:2002;1-6.
    • (2002) Precision Eng. , vol.26 , pp. 1-6
    • Jourlin, Y.1    Jay, J.2    Parriaux, O.3
  • 8
    • 0036132572 scopus 로고    scopus 로고
    • Dimensional effects in CMOS photodiodes
    • Brouk I., Nemirovsky Y. Dimensional effects in CMOS photodiodes. Solid-State Electron. 46:2002;19-28.
    • (2002) Solid-state Electron. , vol.46 , pp. 19-28
    • Brouk, I.1    Nemirovsky, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.