Testing and diagnosing embedded content addressable memories

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 389-394

  Li, Jin Fu ^a   Tzeng, Ruey Shing ^a   Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Associative memory; CADCAM; Cams; Circuit faults; Circuit testing; Computer aided manufacturing; Coupling circuits; Electrical fault detection; Impedance matching; Random access memory

Indexed keywords

ALGORITHMS; ASSOCIATIVE PROCESSING; CAMS; COMPUTER AIDED MANUFACTURING; COMPUTER TESTING; COUPLED CIRCUITS; ELECTRIC FAULT LOCATION; FAULT DETECTION; IMPEDANCE MATCHING (ELECTRIC); INTEGRATED CIRCUITS; RANDOM ACCESS STORAGE; VLSI CIRCUITS;

ASSOCIATIVE MEMORY; CADCAM; CIRCUIT FAULTS; CIRCUIT TESTING; ELECTRICAL FAULT DETECTIONS; RANDOM ACCESS MEMORY;

ASSOCIATIVE STORAGE;

EID: 1642388110     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011169     Document Type: Conference Paper

References (12)

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