An ASIC-embedded content addressable memory with power-saving and design for test features

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2001, Pages 183-187

  Chadwick, T ^a   Gordon, T ^a   Nadkarni, R ^a   Rowland, J ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; COMPUTER SIMULATION; COPPER; DESIGN FOR TESTABILITY; ELECTRIC POWER SUPPLIES TO APPARATUS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; METALLIZING; PHOTOLITHOGRAPHY; SEMICONDUCTING SILICON; STATIC RANDOM ACCESS STORAGE;

COPPER METALLIZATION; EMBEDDED CONTENT ADDRESSABLE MEMORY; POWER DISSIPATION; POWER SAVING;

ASSOCIATIVE STORAGE;

EID: 0034829113     PISSN: 08865930     EISSN: None     Source Type: Journal    
DOI: 10.1109/CICC.2001.929751     Document Type: Article

References (3)

1. Content addressable memory device
2. Test methodologies and design automation for IBM ASICs
3. Test circuit for turn-on and turn-off delay measurements