Growth process of quantum dots precisely controlled by an AFM-assisted technique

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 21, Issue 2-4, 2004, Pages 625-630

  Song, H Z ^a   Nakata, Y ^a   Okada, Y ^b   Miyazawa, T ^a   Ohshima, T ^a   Takatsu, M ^a   Kawabe, M ^b   Yokoyama, N ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Atomic force microscopy; Molecular beam epitaxy; Quantum dot

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; MOLECULAR BEAM EPITAXY; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR GROWTH; WETTING;

PHONON SCATTERING; VERTICAL GROWTH;

SEMICONDUCTOR QUANTUM DOTS;

EID: 1642336736     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2003.11.092     Document Type: Conference Paper

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