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Volumn 66, Issue 1, 2002, Pages 1-4

Saturated ferromagnetism and magnetization deficit in optimally annealed (formula presented) epilayers

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EID: 16344370324     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.66.012408     Document Type: Article
Times cited : (4)

References (38)
  • 2
    • 0035156353 scopus 로고    scopus 로고
    • For a recent review
    • For a recent review, seeH. Ohno and F. Matsukura, Solid State Commun. 117, 179 (2001), and references therein.
    • (2001) Solid State Commun. , vol.117 , pp. 179
    • Ohno, H.1    Matsukura, F.2
  • 7
    • 85038309030 scopus 로고    scopus 로고
    • unpublished
    • (unpublished).
  • 19
    • 85038281385 scopus 로고    scopus 로고
    • UNICAMP), J. d’Albuquerque e Castro (UFRJ), (unpublished)
    • Raimundo R. dos Santos (UFRJ), Luiz E. Oliveira (UNICAMP), J. d’Albuquerque e Castro (UFRJ), (unpublished).
    • Dos Santos, R.R.1
  • 30
    • 85038321137 scopus 로고    scopus 로고
    • The lattice constant is determined through a complex interplay between Mn concentration and the intricate defect structure inherent to these materials. One might suspect that, based on the x-ray data, the large x samples have essentially the same Mn concentration due to diffusion of excess Mn ions to the surface during annealing. We can exclude such a scenario since the EMPA measurements (performed at 3 kV) probe the average Mn concentration in roughly the top half of the (formula presented) epilayers. Since both as-grown and annealed samples give the same EMPA results within experimental uncertainty, it is unlikely that any significant diffusion of Mn ions toward the surface occurs during the annealing process. In addition, such an inhomogeneous distribution of Mn would result in the formation of ferromagnetic MnAs phases since the average Mn concentration is already close to the solubility limit of homogeneous (formula presented) Neither x-ray diffraction nor magnetization measurements indicate any detectable traces of MnAs
    • The lattice constant is determined through a complex interplay between Mn concentration and the intricate defect structure inherent to these materials. One might suspect that, based on the x-ray data, the large x samples have essentially the same Mn concentration due to diffusion of excess Mn ions to the surface during annealing. We can exclude such a scenario since the EMPA measurements (performed at 3 kV) probe the average Mn concentration in roughly the top half of the (formula presented) epilayers. Since both as-grown and annealed samples give the same EMPA results within experimental uncertainty, it is unlikely that any significant diffusion of Mn ions toward the surface occurs during the annealing process. In addition, such an inhomogeneous distribution of Mn would result in the formation of ferromagnetic MnAs phases since the average Mn concentration is already close to the solubility limit of homogeneous (formula presented) Neither x-ray diffraction nor magnetization measurements indicate any detectable traces of MnAs.
  • 32
    • 85038291794 scopus 로고    scopus 로고
    • private communication
    • A. H. MacDonald (private communication).
    • MacDonald, A.H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.