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Applied Physics A: Materials Science and Processing

Volumn 80, Issue 6, 2005, Pages 1301-1304

Surface Reconstruction of Pt/Si(001)

(7) Ji, C a Ragan, R b Kim, S b Chang, Y A a Chen, Y b Ohlberg, D A A b Williams, R Stanley b

a Wisconsin Electric Machines and Power Electronics Consortium (United States)

b HEWLETT PACKARD LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIMERS; ELECTRON TUNNELING; HIGH TEMPERATURE EFFECTS; MORPHOLOGY; PLATINUM; SCANNING TUNNELING MICROSCOPY; SILICON; ULTRAHIGH VACUUM;

INFRARED PYROMETER; INTERCONNECT MATERIALS; SURFACE RECONSTRUCTION; TUNNELING CURRENT;

SURFACE PHENOMENA;

EID: 16344365141 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-004-3150-8 Document Type: Article

Times cited : (4)

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