Fault diagnosis for physical defects of unknown behaviors

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 236-241

  Wen, X ^a   Tamamoto, H ^b   Saluja, K K ^c   Kinoshita, K ^d  

^a SYNTEST TECHNOLOGIES INC   (United States)

^b AKITA UNIVERSITY   (Japan)

^c University of Wisconsin Madison   (United States)

^d OSAKA GAKUIN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS;

FAULT DIAGNOSIS METHOD; FAULT DIAGNOSTICS; FAULT SIMULATION METHOD; PHYSICAL DEFECTS; X-FAULT MODEL;

FAULT DETECTION;

EID: 16244394347     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250816     Document Type: Conference Paper

References (10)

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