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Applied Physics Letters

Volumn 75, Issue 24, 1999, Pages 3883-3885

Alternative method for the activation and measurement of lateral forces using magnetically controlled atomic force microscopy

(5) Jarvis, S P a Tokumoto, H a Yamada, H b Kobayashi, K b Toda, A c

a NATL INST FOR ADV INTERDISC RES (Japan)

b KYOTO UNIVERSITY (Japan)

c OLYMPUS CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042546254 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.125488 Document Type: Article

Times cited : (11)

References (15)

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- OLYMPUS Opt. Co., Ltd., 2951 Ishikawa-cho, Hachioji, Tokyo, Japan.

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- Jarvis, S.P.¹ Yamada, H.² Yamamoto, S.-I.³ Tokumoto, H.⁴

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