-
1
-
-
0003696759
-
-
published by "Deutsches Elektronen-Synchrotron DESY", ISBN 3-935702-06-X
-
TESLA Technical Design Report (on CD) published by "Deutsches Elektronen-Synchrotron DESY", ISBN 3-935702-06-X, 2001, and http://tesla.desy.de
-
(2001)
TESLA Technical Design Report (On CD)
-
-
-
2
-
-
15744398129
-
-
http://xfel.desy.de
-
-
-
-
3
-
-
0035767650
-
Development of thin-film total reflection mirrors for the XUV FEL
-
R.O. Tatchyn, A.K. Freund, and T. Matsushita, SPIE-The International Society for Optical Engineering, San Diego
-
S. Jacobi, J. Wiesmann, B. Steeg, J. Feldhaus, and C. Michaelsen, "Development of thin-film total reflection mirrors for the XUV FEL", Optics for Fourth Generation X-ray Sources, R.O. Tatchyn, A.K. Freund, and T. Matsushita, 4500, 187-192, SPIE-The International Society for Optical Engineering, San Diego, 2001.
-
(2001)
Optics for Fourth Generation X-ray Sources
, vol.4500
, pp. 187-192
-
-
Jacobi, S.1
Wiesmann, J.2
Steeg, B.3
Feldhaus, J.4
Michaelsen, C.5
-
4
-
-
0037965475
-
Characterization of amorphous carbon films as total-reflection mirrors for the XUV free electron lasers
-
A.K. Freund, A.T. Macrander, T. Ishikawa, J.L. Wood, SPIE-The International Society for Optical Engineering, Seattle
-
S. Jacobi, B. Steeg, J. Wiesmann, M. Störmer, J. Feldhaus, R. Bormann, and C. Michaelsen, "Characterization of amorphous carbon films as total-reflection mirrors for the XUV free electron lasers", X-Ray Mirrors, Crystals, and Multilayers II, A.K. Freund, A.T. Macrander, T. Ishikawa, J.L. Wood, 4782, 113-121, SPIE-The International Society for Optical Engineering, Seattle, 2002.
-
(2002)
X-Ray Mirrors, Crystals, and Multilayers II
, vol.4782
, pp. 113-121
-
-
Jacobi, S.1
Steeg, B.2
Wiesmann, J.3
Störmer, M.4
Feldhaus, J.5
Bormann, R.6
Michaelsen, C.7
-
5
-
-
1342347382
-
Total reflection amorphous carbon mirrors for vacuum ultraviolet free electron lasers
-
B. Steeg, L. Juha, J. Feldhaus, S. Jacobi, R. Sobierajski, C. Michaelsen, A. Andrejczuk, and J. Krzywinski,"Total reflection amorphous carbon mirrors for vacuum ultraviolet free electron lasers", Appl. Phys. Lett., 84, 657-659, 2004.
-
(2004)
Appl. Phys. Lett.
, vol.84
, pp. 657-659
-
-
Steeg, B.1
Juha, L.2
Feldhaus, J.3
Jacobi, S.4
Sobierajski, R.5
Michaelsen, C.6
Andrejczuk, A.7
Krzywinski, J.8
-
6
-
-
0001634592
-
IMD-Software for modelling the optical properties of multilayer films
-
D.L. Windt, "IMD-Software for modelling the optical properties of multilayer films", Computers in Physics, 12, 360-370, 1998.
-
(1998)
Computers in Physics
, vol.12
, pp. 360-370
-
-
Windt, D.L.1
-
7
-
-
0004932883
-
X-ray interactions: Photoabsorption scattering, transmission and reflection at 50 - 30000 eV, Z = 1 - 92
-
B.L. Henke, E.M. Gullikson, and J.C. Davis, "X-ray interactions: photoabsorption scattering, transmission and reflection at 50 - 30000 eV, Z = 1 - 92", Atomic Data and Nuclear Data Tables, 54, 181-342, 1993.
-
(1993)
Atomic Data and Nuclear Data Tables
, vol.54
, pp. 181-342
-
-
Henke, B.L.1
Gullikson, E.M.2
Davis, J.C.3
-
8
-
-
15744395477
-
-
http://www.aps.anl.gov/xfd/optics/Deposition.html
-
-
-
-
9
-
-
0033424581
-
Thickness determination of metal thin films with spectroscopic ellipsometry for x-ray mirror and multilayer applications
-
C. Liu, J. Erdmann, J. Maj, A. Macrander, "Thickness determination of metal thin films with spectroscopic ellipsometry for x-ray mirror and multilayer applications", J. Vac. Sci. Technol. A17, 2741-2748, 1999.
-
(1999)
J. Vac. Sci. Technol.
, vol.A17
, pp. 2741-2748
-
-
Liu, C.1
Erdmann, J.2
Maj, J.3
Macrander, A.4
-
10
-
-
0037965484
-
-
SPIE-The International Society for Optical Engineering, Seattle
-
C. Liu, L. Assoufid, A.T. Macrander, G.E. Ice, and J.Z. Tischler, "Profile coating of KB mirrors at the Advanced Photon Source", 4782, 104-112, SPIE-The International Society for Optical Engineering, Seattle, 2002.
-
(2002)
Profile Coating of KB Mirrors at the Advanced Photon Source
, vol.4782
, pp. 104-112
-
-
Liu, C.1
Assoufid, L.2
Macrander, A.T.3
Ice, G.E.4
Tischler, J.Z.5
-
11
-
-
0003314824
-
High-resolution X-ray scattering from thin films and multilayers
-
Springer, Berlin Heidelberg New York
-
V. Holy, U. Pietsch, T. Baumbach, "High-Resolution X-Ray Scattering from Thin Films and Multilayers", Springer Tracts in Modern Physics, Vol. 149, Springer, Berlin Heidelberg New York, 1999.
-
(1999)
Springer Tracts in Modern Physics
, vol.149
-
-
Holy, V.1
Pietsch, U.2
Baumbach, T.3
|