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Volumn 5533, Issue , 2004, Pages 58-65

Investigations of large x-ray optics for free electron lasers

Author keywords

Carbon coating; FEL (free electron laser); Magnetron sputtering; X ray mirrors; X ray optics; XRR (X ray reflectometry)

Indexed keywords

AMORPHOUS FILMS; COATINGS; INTERFEROMETRY; MAGNETRON SPUTTERING; MIRRORS; REFLECTION; SCANNING ELECTRON MICROSCOPY; X RAY OPTICS;

EID: 15744379695     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559619     Document Type: Conference Paper
Times cited : (11)

References (11)
  • 1
    • 0003696759 scopus 로고    scopus 로고
    • published by "Deutsches Elektronen-Synchrotron DESY", ISBN 3-935702-06-X
    • TESLA Technical Design Report (on CD) published by "Deutsches Elektronen-Synchrotron DESY", ISBN 3-935702-06-X, 2001, and http://tesla.desy.de
    • (2001) TESLA Technical Design Report (On CD)
  • 2
    • 15744398129 scopus 로고    scopus 로고
    • http://xfel.desy.de
  • 3
    • 0035767650 scopus 로고    scopus 로고
    • Development of thin-film total reflection mirrors for the XUV FEL
    • R.O. Tatchyn, A.K. Freund, and T. Matsushita, SPIE-The International Society for Optical Engineering, San Diego
    • S. Jacobi, J. Wiesmann, B. Steeg, J. Feldhaus, and C. Michaelsen, "Development of thin-film total reflection mirrors for the XUV FEL", Optics for Fourth Generation X-ray Sources, R.O. Tatchyn, A.K. Freund, and T. Matsushita, 4500, 187-192, SPIE-The International Society for Optical Engineering, San Diego, 2001.
    • (2001) Optics for Fourth Generation X-ray Sources , vol.4500 , pp. 187-192
    • Jacobi, S.1    Wiesmann, J.2    Steeg, B.3    Feldhaus, J.4    Michaelsen, C.5
  • 4
    • 0037965475 scopus 로고    scopus 로고
    • Characterization of amorphous carbon films as total-reflection mirrors for the XUV free electron lasers
    • A.K. Freund, A.T. Macrander, T. Ishikawa, J.L. Wood, SPIE-The International Society for Optical Engineering, Seattle
    • S. Jacobi, B. Steeg, J. Wiesmann, M. Störmer, J. Feldhaus, R. Bormann, and C. Michaelsen, "Characterization of amorphous carbon films as total-reflection mirrors for the XUV free electron lasers", X-Ray Mirrors, Crystals, and Multilayers II, A.K. Freund, A.T. Macrander, T. Ishikawa, J.L. Wood, 4782, 113-121, SPIE-The International Society for Optical Engineering, Seattle, 2002.
    • (2002) X-Ray Mirrors, Crystals, and Multilayers II , vol.4782 , pp. 113-121
    • Jacobi, S.1    Steeg, B.2    Wiesmann, J.3    Störmer, M.4    Feldhaus, J.5    Bormann, R.6    Michaelsen, C.7
  • 6
    • 0001634592 scopus 로고    scopus 로고
    • IMD-Software for modelling the optical properties of multilayer films
    • D.L. Windt, "IMD-Software for modelling the optical properties of multilayer films", Computers in Physics, 12, 360-370, 1998.
    • (1998) Computers in Physics , vol.12 , pp. 360-370
    • Windt, D.L.1
  • 7
    • 0004932883 scopus 로고
    • X-ray interactions: Photoabsorption scattering, transmission and reflection at 50 - 30000 eV, Z = 1 - 92
    • B.L. Henke, E.M. Gullikson, and J.C. Davis, "X-ray interactions: photoabsorption scattering, transmission and reflection at 50 - 30000 eV, Z = 1 - 92", Atomic Data and Nuclear Data Tables, 54, 181-342, 1993.
    • (1993) Atomic Data and Nuclear Data Tables , vol.54 , pp. 181-342
    • Henke, B.L.1    Gullikson, E.M.2    Davis, J.C.3
  • 8
    • 15744395477 scopus 로고    scopus 로고
    • http://www.aps.anl.gov/xfd/optics/Deposition.html
  • 9
    • 0033424581 scopus 로고    scopus 로고
    • Thickness determination of metal thin films with spectroscopic ellipsometry for x-ray mirror and multilayer applications
    • C. Liu, J. Erdmann, J. Maj, A. Macrander, "Thickness determination of metal thin films with spectroscopic ellipsometry for x-ray mirror and multilayer applications", J. Vac. Sci. Technol. A17, 2741-2748, 1999.
    • (1999) J. Vac. Sci. Technol. , vol.A17 , pp. 2741-2748
    • Liu, C.1    Erdmann, J.2    Maj, J.3    Macrander, A.4
  • 11
    • 0003314824 scopus 로고    scopus 로고
    • High-resolution X-ray scattering from thin films and multilayers
    • Springer, Berlin Heidelberg New York
    • V. Holy, U. Pietsch, T. Baumbach, "High-Resolution X-Ray Scattering from Thin Films and Multilayers", Springer Tracts in Modern Physics, Vol. 149, Springer, Berlin Heidelberg New York, 1999.
    • (1999) Springer Tracts in Modern Physics , vol.149
    • Holy, V.1    Pietsch, U.2    Baumbach, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.