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Volumn 14, Issue 42, 2002, Pages 9899-9911

Weak-field carrier hopping in disordered organic semiconductors: The effects of deep traps and partly filled density-of-states distribution

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CHARGE CARRIERS; COMPUTER SIMULATION; ELECTRON TRAPS; MONTE CARLO METHODS; THERMAL EFFECTS;

EID: 0037191308     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/42/305     Document Type: Article
Times cited : (115)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.