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Thin Solid Films

Volumn 409, Issue 2, 2002, Pages 198-205

Effects of impurities on the optical properties of poly-3-hexylthiophene thin films

(4) Erwin, Meg M a McBride, James a Kadavanich, Andreas V a Rosenthal, Sandra J a

a VANDERBILT UNIVERSITY (United States)

Author keywords

Impurities; Optical spectroscopy; Polymers; Rutherford back scattering spectroscopy (RBS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY (OPTICAL); IMPURITIES; LIGHT ABSORPTION; MATHEMATICAL MODELS; PLASTIC FILMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THICKNESS MEASUREMENT;

OPTICAL SPECTROSCOPY;

THIN FILMS;

EID: 0037197347 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(02)00124-4 Document Type: Article

Times cited : (47)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.