Determination of CoSi 2 self-aligned nanostructures with grazing incidence X-ray absorption spectroscopy

Journal of Physical Chemistry B

Volumn 109, Issue 9, 2005, Pages 4118-4122

  Carter, Joshua D ^a   Shan, Fang ^a   Guo, Ting ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COORDINATION SHELLS; DEIONIZATION; ELASTIC SCATTERING; FIELD EMISSION;

ABSORPTION SPECTROSCOPY; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; GREEN'S FUNCTION; IONIZATION; SUBSTRATES; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 15544362675     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp044836q     Document Type: Article

References (20)

1. Wang, Z. L. Characterization of nanophase materials; Wiley-VCH: Weinheim, Germany, and New York, 2000.
2. Schmid, G.; Pugin, R.; Sawitowski, T.; Simon, U.; Marler, B. Chem. Commun. 1999, 1303-1304.
3. Schnepf, A.; Schnockel, H. Angew. Chem., Int. Ed. 2001, 40, 712-715.
4. Carter, J. D.; Cheng, G.; Guo, T. J. Phys. Chem. B 2004, 108, 6901-6904.
5. Pearson, W. B. A handbook of lattice spacings and structures of metals and alloys; Pergamon Press: New York, 1967.
6. Silicide Thin Films - Fabrication, Properties, and Applications; Tung, R., Maex, K., Pellegrini, P. W., Allen, L. H., Eds.; MRS: Boston, MA, 1996; Vol. 402.
7. Koningsberger, R. D. C. A. X-ray Absorption: Principles, Applications, Techniques of EXAFS, SEXAFS and XANES; John Wiley & Sons: New York, 1988.
8. Bargar, J. R.; Trainor, T. P.; Fitts, J. P.; Chambers, S. A.; Brown, G. E. Langmuir 2004, 20, 1667-1673.
9. Towle, S. N.; Bargar, J. R.; Brown, G. E.; Parks, G. A. J. Colloid Interface Sci. 1999, 217, 312-321.
10. Fitts, J. P.; Trainor, T. P.; Grolimund, D.; Bargar, J. R.; Parks, G. A.; Brown, G. E. J. Synchrotron Radiat. 1999, 6, 627-629.
11. Platow, W.; Wood, D. E.; Burnette, J. E.; Nemanich, R. J.; Sayers, D. E. J. Synchrotron Radiat. 2001, 8, 475-477.
12. Platow, W.; Wood, D. K.; Tracy, K. M.; Burnette, J. E.; Nemanich, R. J.; Sayers, D. E. Phys. Rev. B 2001, 6311, 5312-+.
13. Rossi, G.; Jin, X.; Santaniello, A.; DePadova, P.; Chandesris, D. Phys. Rev. Lett. 1989, 62, 191-194.
14. Ersen, O.; Pierron-Bohnes, V.; Tuilier, M. H.; Pirri, C.; Khouchaf, L.; Gailhanou, M. Phys. Rev. B 2003, 6709, 4116.
15. Puntes, V. F.; Krishnan, K. M.; Alivisatos, A. P. Science 2001, 291, 2115-2117.
16. http://www-ssrl.slac.stanford.edu/exafspak.html.
17. http://leonardo.phys.washington.edu/feff/.
18. Geller, S. Acta Crystallogr. 1955, 8, 83-87.
19. Pong, W. F.; Chang, Y. K.; Mayanovic, R. A.; Ho, G. H.; Lin, H. J.; Ko, S. H.; Tseng, P. K.; Chen, C. T.; Hiraya, A.; Watanabe, M. Phys. Rev. B-Condens. Matter 1996, 53, 16510-16515.
20. Alberti, A.; La Via, F.; Spinella, C.; Rimini, E. Microelectron. Eng. 2001, 55, 163-169.