A simple method for in situ determination of linear thermal expansion coefficients of thin films

ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)

Volumn 2000-N, Issue , 2000, Pages 105-112

  Pan, Chi Hsiang ^a  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL MODELS; ELASTIC MODULI; FILM THICKNESS; FINITE ELEMENT METHOD; MICROSTRUCTURE; NONLINEAR ANALYSIS; THERMAL EXPANSION;

COEFFICIENT MEASUREMENT; COMPACT MICROSTRUCTURE; CORRECTION FACTORS; HEATING STAGE; OPTICAL MICROSCOPES; SIMPLE METHOD; THERMAL STRAIN; THIN-FILMS; TWO BEAMS; YOUNG MODULUS;

THIN FILMS;

EID: 1542801547     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2000-2291     Document Type: Conference Paper

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