Imaging and direct manipulation of nanoscale three-dimensional features using the noncontact atomic force microscope

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 1425-1429

  Ramachandran, T R ^a   Madhukar, A ^a,b   Chen, P ^a   Koel, B E ^a,b  

^a University of Southern California ^*  (United States)

^b Department of Physics ^*

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGING; ATOMIC FORCE MICROSCOPES; DIRECT MANIPULATION; FEED-BACK LOOP; GOLD PARTICLES; IMAGE CONTRASTS; IN-SITU; MATERIALS SYSTEMS; NANO SCALE; NANO-SIZED; NANOMANIPULATIONS; NON-CONTACT; ROOM TEMPERATURE; THREE-DIMENSIONAL (3D); TIP-SAMPLE CONTACT; TIP-SAMPLE INTERACTION;

ATOMIC FORCE MICROSCOPY; MICROMANIPULATORS; NANOTECHNOLOGY; VACUUM;

THREE DIMENSIONAL;

EID: 1542688930     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581162     Document Type: Article

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