Modeling structural metastability of irradiated thin films

Surface Science

Volumn 554, Issue 1, 2004, Pages 1-9

  Ossi, P M ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Interface states; Ion bombardment; Metallic films; Nucleation; Surface electrical transport (surface conductivity, surface recombination, etc.); Surface thermodynamics (including phase transitions)

Indexed keywords

AMORPHOUS MATERIALS; CHARGE TRANSFER; CRYSTALLINE MATERIALS; DIMERS; ELECTRIC CONDUCTIVITY; INTERFACES (MATERIALS); ION BOMBARDMENT; MATHEMATICAL MODELS; METALLIC FILMS; NUCLEATION; PHASE TRANSITIONS; THERMODYNAMICS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

INTERFACE STATES; SURFACE ELECTRICAL TRANSPORT;

THIN FILMS;

EID: 1542400261     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.02.013     Document Type: Article

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