A Combined Infrared/Visible Photoemission Microscope

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 1999, Pages 457-464

  Trigg, A D ^a  

^a INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; INFRARED RADIATION; MICROELECTRONICS; MICROPROCESSOR CHIPS; MICROSCOPIC EXAMINATION; PHOTOEMISSION; SEMICONDUCTING CADMIUM TELLURIDE;

FOCAL PLANE ARRAY (FPA); INFRARED PHOTOEMISSION MICROSCOPES (IRPEM);

INTEGRATED CIRCUIT TESTING;

EID: 1542360671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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