Effects of post-annealing on the dielectric properties of Au/BaTiO 3/Pt thin film capacitors

Materials Letters

Volumn 58, Issue 11, 2004, Pages 1715-1721

  Lee, E J H ^a   Pontes, F M ^a   Leite, E R ^a   Longo, E ^a   Magnani, R ^a   Pizani, P S ^a   Varela, J A ^b  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

Barium titanate; Conduction mechanism; Dielectric properties; Post annealing

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; CAPACITORS; DIELECTRIC PROPERTIES; DIELECTRIC RELAXATION; ELECTRIC CONDUCTIVITY; ELECTRIC SPACE CHARGE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

POST-ANNEALING; SPACE-CHARGE LIMITED (SCL) CONDUCTION;

THIN FILMS;

EID: 1542303368     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2003.10.047     Document Type: Article

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