Dielectric properties of Mg-doped Ba0.96Ca0.04Ti0.84Zr0.16O 3 thin films fabricated by metalorganic decomposition method

Applied Physics Letters

Volumn 78, Issue 22, 2001, Pages 3517-3519

  Yi, Woo Chul ^a   Kalkur, T S ^a   Philofsky, Elliott ^b   Kammerdiner, Lee ^b   Rywak, Anthony A ^c  

^a UNIVERSITY OF COLORADO   (United States)

^b Applied Ceramics Research   (United States)

^c Gennum Corporation   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035926909     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1375002     Document Type: Article

References (14)

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