Optical propagation loss of ZnO films grown on sapphire

Journal of Applied Physics

Volumn 95, Issue 4, 2004, Pages 1673-1676

  Ashida, A ^a   Ohta, H ^a   Nagata, T ^a   Nakano, Y ^a   Fujimura, N ^a   Ito, T ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; FILM GROWTH; MAGNETRON SPUTTERING; OPTICAL DEVICES; OPTICAL VARIABLES MEASUREMENT; SAPPHIRE; SURFACE ROUGHNESS; TEMPERATURE; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CHARGED COUPLED DEVICE DETECTION METHOD; GRAIN ORIENTATION; OPTICAL PROPAGATION LOSS; PROPAGATION DISTANCE;

LIGHT PROPAGATION;

EID: 1542288843     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1639143     Document Type: Article

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