|
Volumn , Issue , 2004, Pages 49-52
|
Ultra-low-voltage robust design issues in deep-submicron CMOS
a,b
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DATA RETENTION VOLTAGE (DRV);
STATIC-NOISE MARGIN (SNM);
SYSTEM-ON-A-CHIP (SOC) INTEGRATION;
VOLTAGE TRANSFER CURVES (VTC);
ELECTRIC POTENTIAL;
LEAKAGE CURRENTS;
LOGIC DESIGN;
MATHEMATICAL MODELS;
MOS CAPACITORS;
MOSFET DEVICES;
PERSONAL DIGITAL ASSISTANTS;
STATISTICAL METHODS;
TRANSISTORS;
CMOS INTEGRATED CIRCUITS;
|
EID: 14844303791
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (12)
|
References (8)
|