Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3791, Issue , 1999, Pages 40-48

  Inouye, Yasushi ^a   Hayazawa, Norihiko ^a   Hayashi, Koji ^a   Sekkat, Zouheir ^a   Kawata, Satoshi ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; FLUORESCENCE; LIGHTING; MICROSCOPES; MOLECULAR VIBRATIONS; PROBES; RAMAN SCATTERING; STRAY LIGHT;

EVANESCENT LIGHT FIELD SPOT; METALLIC PROBE TIP; NANOSPECTROSCOPY; NEAR FIELD SCANNING OPTICAL MICROSCOPE; SURFACE ENHANCED RAMAN SCATTERING;

OPTICAL MICROSCOPY;

EID: 0033327562     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)