Present developments in high-resolution transmission electron microscopy

Current Opinion in Solid State and Materials Science

Volumn 2, Issue 4, 1997, Pages 469-476

  Ernst, Frank ^a   Rühle, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

HAADF high angle annular dark field HRTEM high resolution transmission electron microscopy

Indexed keywords

EID: 0000652219     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-0286(97)80092-7     Document Type: Article

References (46)

1. Haider M, Braunshausen G, Schwan E. Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-corrector. Optik. 99:1995;167-179.
2. Hofmann D, Ernst F. Quantitative HRTEM of the incoherent twin boundary in Cu. Ultramicroscopy. 53:1994;205-221.
3. Ernst F, Hofmann D, Nadarzinski K, Stemmer S, Streiffer SK. Quantitative high-resolution electron microscopy of interfaces. Ferro AC, Conde EP, Fortes EA. Intergranular and Interphase Boundaries in Materials. 1:1996;23-34 Trans Tech Publications, Zürich. (Materials Science Forum 207-209).
4. Nadarzinski K, Ernst F. The atomistic structure of a Σ=3, (111) grain boundary in NiAl, studied by quantitative high-resolution transmission electron microscopy. Phil Mag A. 74:1996;641-664 Method of iterative digital matching of simulated and experimental HRTEM images, applied to determine the atomistic structure of a grain boundary in NiAl, and quantitative analysis of electron beam damage on the reliability of atom column positions.
5. Kienzle O, Exner M, Ernst F. Analysis of interface structures by quantitative high-resolution transmission electron microscopy. Hamers R, Smith DJ. Atomic Resolution Microscopy of Surfaces and Interfaces. 1997;Materials Research Society, Pittsburgh. in press.
6. Möbus G. Retrieval of crystal defect structures from HREM images by simulated evolution. I. Basic technique. Ultramicroscopy. 65:1996;205-216 This paper introduces a powerful implementation of structure refinement by iterative digital matching of simulated and experimental images, and discusses the limitation of this method.
7. Möbus G, Dehm G. Retrieval of crystal defect structures from HREM images by simulated evolution. II. Experimental image evaluation. Ultramicroscopy. 65:1996;217-228.
8. Cheng YF, Neuchter W, Mayer J, Weickenmeier A, Gjnnes J. Low-order structure-factor amplitude and sign determination of an unknown structure AlmFe by quantitative convergent-beam electron diffraction. Acta Cryst A. 52:1996;936.
9. Jiang Hua C, Op de Beeck M, Van Dyck D. Can the multislice method be used to calculate HOLZ reflections in high-energy electron diffraction and imaging? Microsc Microanal Microstruct. 7:1996;27-47.
10. Dehm G, Nadarzinski K, Ernst F, Rühle M. Quantificationof irradiation damage generated during HRTEM with 1250 keV electrons. Ultramicroscopy. 63:1996;49-55 Quantitative analysis of electron beam damage on the reliability of atom column positions as obtained by iterative digital matching of simulated and experimental images.
11. Lichte H. Electron holography. I. Can electron holography reach 0.1 nm resolution? Ultramicroscopy. 47:1992;223-230.
12. Lichte H, Völkl E. Electron holography. II. First steps of high resolution electron holography into materials science. Ultramicroscopy. 47:1992;231-240.
13. Lichte H. Artefacts in electron holography. Ultramicroscopy. 64:1996;67-77.
14. Orchowski A, Lichte H. High-resolution electron holography of non-periodic structures at the example of a Σ=13 grain boundary in gold. Ultramicroscopy. 64:1996;199-209 This article reports on a first application of high-resolution electron hologramphy to solve the atomistic structure of a grain boundary.
15. Coene WMJ, Thrust A, Op de Beeck M, Van Dyck D. Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy. 64:1996;109-135.
16. Thust A, Overwijk MHF, Coene WMJ. Numerical correction of lens aberrations in phase-retrieval HRTEM. Ultramicroscopy. 64:1996;249-264.
17. Thust A, Coene WMJ. Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy. 64:1966;211-230.
18. Op de Beeck M, Van Dyck D, Coene W. Wave function reconstruction in HRTEM: the parabola method. Ultramicroscopy. 64:1996;167-183 Retrieval of the electron wave function at the exit plane of the object by evaluating a series of HRTEM images recorded at different objective lens focus settings.
19. Op de Beeck M, Van Dyck D. Direct structure reconstruction in HRTEM. Ultramicroscopy. 64:1996;153-165.
20. Van Dyck D, Lichte H, van der Mast KD. Sub-Ongstrsm structure characterisation: the Brite-Euram route towards one Ongstrsm. Ultramicroscopy. 64:1996;1-15 Overview about competing approaches to increase the resolution limit of high-resolution transmission electron microscopy by retrieving the electron wave function at the exit plane of the object and to reconstruct the object structure from this wave function.
21. Van Dyck D, Op de Beeck M. A simple intuitive theory for electron diffraction. Ultramicroscopy. 64:1996;99-107 This paper presents a new concept to describe dynamical electron diffraction in thin crystals. This concept allows an intuitive understanding of the correlation between structure of the object and the electron wave function that describes the electron diffraction at the exit plane of the object under coherent illumination.
22. Tang D, Zandbergen HW, Jansen J, Op de Beeck M, Van Dyck D. Fine-tuning of the focal residue in exit-wave reconstruction. Ultramicroscopy. 64:1996;265-276.
23. Lentzen M, Urban K. Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function. Ultramicrospy. 62:1996;249-264.
24. Pennycook SJ, Browning ND, McGibbon MM, McGibbon AJ, Jesson DE, Chisholm MF. Direct determination of interface structure and bonding with the scanning transmission electron microscope. Philos Trans Royal Soc Lond Series A. 354:1996;2619-2634 Principles of high-resolution imaging in a nanoprobe STEM by means of a HAADF detector, and the impact of this technique on analytical TEM.
25. Pennycook SJ, Browning ND, McGibbon MM, McGibbon AJ, Chisholm MF, Jesson DE. Determination of interface structure and bonding by Z - contrast STEM. Diffus Defect Data Part B. 47:1996;561-571 Principles of HAADF imaging and its combination with analytical TEM at high spatial resolution.
26. Hartel P, Rose H, Dinges C. Conditions and reasons for incoherent imaging in STEM. Ultramicroscopy. 63:1996;93-114 Theoretical fundament of HAADF imaging in a dedicated STEM.
27. Browning ND, Pennycook SJ. Direct experimental determination of the atomic structure at internal interfaces. J Phys D. 29:1996;1779-1798 Application of HAADF imaging to solve interface structures.
28. McGibbon MM, Browning ND, McGibbon AJ, Pennycook SJ. The atomic structure of asymmetric [001] tilt boundaries in SrTiO3. Phil Mag A. 73:1996;625-641.
29. McGibbon AJ, Pennycook SJ. Direct atomic resolution imaging of dislocation core structures in a 300 kV STEM. Microsc Semiconduc Mater. 1995:1995;79-82.
30. McGibbon AJ, Pennycook SJ, Angelo JE, Mills MJ. Direct sub-lattice imaging of interface dislocation structures in CdTe/GaAs(001). Demczyk BG. Evolution of Thin Film and Surface Structure and Morphology. 1995;625-630 Materials Research Society, Pittsburgh. (Mater Res Soc SYmp Proc 355).
31. McGibbon AJ, Pennycook SJ, Angelo JE. Direct observation of dislocation core structures in CdTe/GaAs(001). Science. 269:1995;519-521.
32. Amali A, Rez P. Theory of lattice resolution in high-angle annular dark-field images. Microsc Microanal. 3:1997;28-46 A theory of high-angle electron scattering and the formation mechanism of high-resolution images obtained in scanning transmission electron microscopes with a high-angle annular dark-field detector.
33. Bengu E, Plass R, Marks LD, Ichihashi T, Ajayan PM, Iijima S. Imaging the dimers in Si(111)-(7 × 7). Phys Rev Lett. 77:1996;4226-4228 Pioneering work demonstrating the power of image processing by solving the two-dimensional atomistic structure of reconstructed crystal surfaces from plan-view HRTEM images.
34. Marks LD, Plass R. Atomic structure of Si(111)-(5 × 2)-Au from high resolution electron microscopy and heavy-atom holography. Phys Rev Lett. 75:1995;2172-2175.
35. Marks LD. Wiener-filter enhancement of noisy HREM images. Ultramicroscopy. 62:1996;1-2.
36. Burden AP, Hutchison JL. Real-time observation of fullerene generation in a modified electron microscope. J Cryst Growth. 158:1996;1-2.
37. Füller T, Banhart F. In situ observation of the formation and stability of single fullerene molecules under electron irradiation. Chem Phys Lett. 254:1996;5-6.
38. Zwanger MS, Banhart F, Seeger A. Formation and decay of spherical concentric-shell carbon clusters. J Cryst Growth. 163:1996;445-454.
39. Banhart F. Carbon onions as nanoscopic pressure cells for diamond formation. Nature. 382:1996;433-435 In situ observation of diamond formation in carbon onions under irradiation with high-energy electrons.
40. Wunderlich W. Theoretical considerations about grain boundary migration in fcc metals. Ferro AC, Conde EP, Fortes EA. Intergranular and Interphase Boundaries in Materials. 1:1996;141-144 Trans Tech Publications, Zürich. (Materials Science Forum 207-209).
41. Campbell GH, Chan DK, Medlin DL, Angelo JE, Carter CB. Dynamic observation of the FCC to 9R shear transformation in a copper S=3 incoherent twin boundary. Scr Mater. 35:1996;837-842 In situ HRTEM observation of a structural transition in a Cu grain boundary.
42. Kamino T, Yaguchi T, Ukiana M, Yasutomi Y, Saka H. Application of HREM in situ heating experiments to the study of dynamical behaviour of grain boundaries at very high temperatures. Ferro AC, Conde EP, Fortes EA. Intergranular and Interphase Boundaries in Materials. 2:1996;489-492 Trans Tech Publications, Zürich. (Materials Science Forum 207-209).
43. Medlin DL. Climb and glide of a/3<111 > dislocations in an aluminium Sigma=3 boundary. Phil Mag A. 75:1997;733-747 In situ HRTEM observations of moving grain boundary dislocations and implications for the accommodation of crystal dislocations by moving grain boundaries.
44. Xiao S, Johnson E, Hinderberger S, Hohansen A, Bourdelle K, Dahmen U. In-situ high-resolution electron microscopy observations of nanometre-sized Pb inclusions in Al near their melting point. J Microsc. 180:1995;61-69.
45. Kamino T, Yaguchi T, Tomita M, Saka H. In-situ high-resolution electron microscopy study on a surface reconstruction of Au-deposited Si at very high temperatures. Phil Mag A. 75:1997;105-114.
46. Kolar HR, Spence JCH, Alexander H. Observation of moving dislocation kinks and unpinning. Phys Rev Lett. 77:1996;4031-4034 This paper demonstrates the application of in situ HRTEM to obtain quantitative data on dislocation motion.