Interference in electron Compton scattering for silicon

Journal of Physics Condensed Matter

Volumn 8, Issue 16, 1996, Pages 2835-2850

  Exner, A ^a,b   Kohl, H ^a,c   Nelhiebel, M ^a   Schattschneider, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b Inst Stromungslehre W   (Austria)

^c UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0343587458     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/8/16/013     Document Type: Article

References (10)

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4. Exner A, Kohl H, Schattschneider P and Jonas P 1994 J. Phys.: Condens. Matter 6 3443
5. Jonas P and Schattschneider P 1993 J. Phys.: Condens. Matter 5 7173
6. Press W H, Fannery B P, Teukolsky S A and Vetterling W T 1986 Numerical Recipes (Cambridge: Cambridge University Press)
7. Reimer L 1984 Transmission Electron Microscopy (Berlin: Springer)
8. Schattschneider P, Pongratz P and Hohenegger P 1990 Scanning Microsc. Suppl. 4 35
9. Schülke W and Mourikis S 1986 Acta Crystallogr. A 42 86
10. Spiertz A, Höppner K, Gabriel K, Kaprolat A and Schülke W 1994 Sagamore XI (Brest) ed G Loupias and S Rabii; Université Pierre et Marie Curie, extended abstracts, p 107